Krzysztof Dziarski (4)

Determination of Transmittance of IR Windows made of CaF2 within Operational Temperatures of Electric Devices

Measurement of the Junction Temperature of Light-Emitting Diodes Based on the Thermographic Measurement of the Case Temperature

Uncertainty of Thermographic Temperature Measurement of Electric Units Contained in Switchgear

Verification of the die Temperature of a SiC Transistor Based on the Thermal Imaging and Machine Learning